Summary
Luis Iam is a seasoned hardware and NAND flash memory architect, currently serving as NVE Media Architect at Micron Technology in Milpitas, CA, with nine years of storage memory experience. He leads test engineering for next-generation NAND, driving cross-functional debugging, validation, and optimization of NAND designs. At SanDisk, he pioneered ML-based testing strategies, endurance modeling, and standardized data logging to improve cross-functional data sharing and program productivity. Notable achievements include leading testing of the industry’s first 2-tier 3D NAND from NPI to MP with a Flash Memory Summit Best Memory award, and delivering a trimming algorithm that boosted 3D NAND consistency by 32%, while cutting factory test time by 15% and saving $8.5M in CapEx through software optimization. He also built automated yield and test-time discrepancy reporting and mentored teams to raise program velocity. He holds a Bachelor of Applied Science in Electrical Engineering from UCLA (GPA 3.93) and an Electrical Engineering degree from Pasadena City College (GPA 3.97).
10 years of coding experience
12 years of employment as a software developer
Electrical and Electronics Engineering, 3.97, Electrical and Electronics Engineering, 3.97 at Pasadena City College
Bachelor of Applied Science, Electrical Engineering, 3.93, Bachelor of Applied Science, Electrical Engineering, 3.93 at University of California, Los Angeles
English, Chinese, Chinese