Summary
Abhinav Tripathi is an AI engineer with 10 years of experience applying deep learning and computer vision to semiconductor inspection, currently shaping defect detection, classification, and SEM image enhancement at KLA. He builds production-ready models and systems that address customer inspection challenges and occasionally uncovers deep, hard-to-find bugs in complex pipelines. His academic work at IIT Kanpur produced a geolocalization CNN with a dual-backbone trained on 108k satellite–UAV pairs, outperforming siamese approaches, and he has hands-on research experience evaluating keypoint detectors at the University of Bonn. Comfortable moving models from research to deployment, he blends strong theoretical grounding (MTech/BTech, IIT Kanpur) with pragmatic engineering. Based in Chennai, he combines domain-specific imaging expertise with a track record of delivering impactful solutions in high-stakes manufacturing environments.
9 years of coding experience
Indian Institute of Technology Kanpur