Summary
Chris Nappi is a Technical Director with 12+ years of focused experience (and a longer tenure at NXP dating back to the late 1990s) leading MCU and MPU test architecture for NXP families including MCX, Kinetis, i.MX and RT. He specializes in semiconductor test architecture, NPI test development, and low-cost, high-quality ATE strategies across Teradyne and Advantest platforms, with deep RTL/Verilog debug skills and multi-language tooling proficiency. Chris drove next-generation Trust Provisioning test harvesting and certificate methodologies and co-developed instrument-less on-chip ATE testing, enabling modular pre/post-silicon test reuse across product lines. A co-founding member of the Origen core team, he blends open-source semiconductor test innovation with pragmatic process design to scale test architecture and security co-existence in production. Based in Austin and grounded in a UT Austin CEE background, he is known for translating complex silicon and security requirements into practical, auditable test solutions.
12 years of coding experience
BS, Computer and Electrical Engineering, BS, Computer and Electrical Engineering at The University of Texas at Austin
Plano Senior High
English