Senior Microelectronics Research Engineer at Draper
Boston, Massachusetts, United States
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Summary
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Senior
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Clio Batali is a senior microelectronics research engineer with 11 years of cross-scale R&D experience in nanofabrication, metrology, and thin-film characterization. Trained at MIT (BS) and Cornell (MEng) in Materials Science and Engineering, she has led process and tool ownership, DoE, and infrastructure overhauls for semiconductor metrology at IBM and now drives MEMS metrology efforts at Draper. Her background spans optical and x‑ray thin-film metrology, overlay emulation, and database-driven metrics systems, blending hands-on lab expertise with data-centric process optimization. Clio’s early work in photovoltaics, bioinformatics, and microfluidic synthesis highlights a curiosity for diverse techniques and rapid prototyping. She’s known for translating complex experimental workflows into reproducible, scalable processes and enjoys tinkering with both instrumentation and materials. Based in Boston, she brings a practical inventiveness to bridging fundamental materials insight and production-ready measurement solutions.
11 years of coding experience
7 years of employment as a software developer
BS Materials Science and Engineering, BS Materials Science and Engineering at Massachusetts Institute of Technology
MEng Materials Science and Engineering, MEng Materials Science and Engineering at Cornell University
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Clio Batali - Senior Microelectronics Research Engineer at Draper