Dan Bodoh is a Technical Director with 16+ years of experience specializing in semiconductor electrical failure analysis and the development of hardware and software tools that make complex diagnostics practical and user-friendly. He combines deep domain expertise in techniques like dynamic laser stimulation, time-resolved emission, and nanoprobing with strong software chops in Java and C to deliver tools for fault isolation, CAD navigation, and automated FA reporting. At NXP (and previously Freescale) he has led technical efforts from hands-on failure analysis to building software-based diagnosis systems that leverage design and test data. A pragmatic engineer, he focuses on tools that not only work but are easy for analysts to adopt, and he has supported the community through ISTFA leadership and society board service.
15 years of coding experience
MS Electrical Engineering, Semiconductors, MS Electrical Engineering, Semiconductors at University of Wisconsin-Madison
BS, Computer Science and Engineering, BS, Computer Science and Engineering at Milwaukee School of Engineering
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Dan Bodoh - Technical Director at NXP Semiconductors