David Overgaard is a pragmatic probe test engineer with 12 years of experience building C++ test software and automation for high-volume DRAM wafer testing at Micron. He combines an electrical engineering background in embedded systems with ongoing master's coursework in computer science from UIUC, bringing both hardware-level insight and software design discipline to complex test flows. Known for automating analysis and repair processes, he integrates worldwide probe efforts and crafts tools that turn raw tester data into actionable repairs. He also has hands-on teaching and internship experience in PCB design, embedded C, and test documentation, which informs his clear, reusable approach to OOA/D and refactoring.
12 years of coding experience
Bachelor of Science, Electrical Engineering - Embedded systems, Bachelor of Science, Electrical Engineering - Embedded systems at Oregon State University
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David Overgaard - Probe Test Engineer 3 at Micron Technology