Principal Wafer Metrology Engineer at Western Digital
California, United States
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Summary
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Enrique López-guerra is a Principal Wafer Metrology Engineer with 11 years of experience blending academic research and industry practice in optical and nanoscale characterization. He leads metrology efforts at Western Digital, managing large fleets of AFM, interferometry, ellipsometry, and reflectometry tools while building Python-driven automation for data analysis, excursion tracking, and reporting. Holding a PhD in Mechanical Engineering with 300+ citations, he has translated advanced AFM and reflectometry techniques from publications into production-capable solutions for thicker films. His background spans hands-on instrument support, fast-probing wavelet methods, and materials synthesis, giving him a rare combination of experimental, computational, and manufacturing-facing expertise. Based in California, he is known for turning complex measurement challenges into automated, scalable workflows that improve yield and enable new metrology capabilities.
11 years of coding experience
10 years of employment as a software developer
Master's degree, Chemical Engineering, Master's degree, Chemical Engineering at Kyung Hee University
Doctor of Philosophy - PhD, Mechanical Engineering, Doctor of Philosophy - PhD, Mechanical Engineering at The George Washington University
The University of Maryland, College Park
Ingeniero Químico, Chemical Engineering, Ingeniero Químico, Chemical Engineering at Universidad del Valle de Guatemala
Contributions:4 pushes, 1 branch in 2 years 2 months
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