Erik Marinissen is Scientific Director at imec and a visiting researcher at TU/e, leading advanced research in test and design-for-test for cutting-edge technologies such as TSV-based 3D-stacked ICs, silicon photonics, sub-10nm CMOS and STT-MRAM. He marries deep academic roots—MSc in Computing Science and a PDEng in Software Technology—with extensive industry experience from Philips Research and NXP, and has supervised over 40 graduate students. A prolific researcher and inventor, he is co-author of 275+ publications and co-inventor on eighteen patent families, and has shaped standards as Editor-in-Chief of IEEE Std 1500 and founder/vice-chair of IEEE P1838. Beyond research leadership he founded several influential workshops (DSNOC, 3DIW, 3D-TEST) and has chaired major conferences, reflecting a rare blend of technical depth and community-building. His specialties span ATPG, BIST, ATE, probe technology and memory testing, positioning him at the intersection of device physics and system-level test architectures. Notably, he leverages imec’s wafer-fab infrastructure to translate test concepts into practical solutions used across industry and academia.
8 years of coding experience
Ongedeeld VWO, Ongedeeld VWO at RSG Petrus Hondius
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