Scientist For EUV Layer Metrology at Zeiss Semiconductor Manufacturing Technology
Hamburg, Germany
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Summary
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Senior
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Felix Bourier is a computational physicist and applied-AI practitioner with nine years of experience translating complex measurement and simulation problems into robust, production-ready software for semiconductor and academic research. Currently a Scientist for EUV layer metrology at ZEISS SMT in Hamburg, he designs optimized measurement techniques, ETL pipelines, and interactive dashboards that accelerate data-driven decisions in next-generation semiconductor manufacturing. His background—PhD in Physical Chemistry (magna cum laude) and hands-on experimental research on nanoparticle nucleation—gives him rare fluency across wet-lab physics, data modeling, and machine learning for predictive maintenance. Felix is known for improving code quality and automation across interdisciplinary teams and for safeguarding sensitive project data, blending scientific rigor with pragmatic engineering. He maintains a personal web presence demonstrating his cross-domain projects and tooling, signaling an ongoing commitment to reproducible research and applied software.
9 years of coding experience
PhD, Physical Chemistry, Magna cum laude, PhD, Physical Chemistry, Magna cum laude at University of Hamburg
Master of Science, Chemistry, 1.0, Master of Science, Chemistry, 1.0 at Universität Hamburg
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Felix Bourier - Scientist For EUV Layer Metrology at Zeiss Semiconductor Manufacturing Technology