Francisco Pelaez is a Full Professor of Electronics at Universidad Complutense de Madrid with over a decade of academic and research experience focused on radiation effects in electronic devices. His work on displacement damage, total ionising dose and soft errors in SRAMs has informed large-scale projects like CERN’s LHC and ITER, and he has developed portable platforms for in-field SRAM testing. He combines hands-on experimental techniques—such as laser-induced single-event transient studies—with pedagogy across undergraduate and graduate programs. Based in Madrid, he holds a PhD in Electronics and a background in physics, bringing a rare blend of deep device-level expertise and applied system testing. Notably, his research outputs have translated into practical testing tools used beyond the lab in high-radiation environments.
10 years of coding experience
University of Seville
Degree in Physics, Degree in Physics at Universidad de Extremadura
Doctor, Electronics. Radiation effects on electronic components, Doctor, Electronics. Radiation effects on electronic components at Universidad Complutense de Madrid
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