Summary
Gunho Lee is a seasoned Application Engineer with over 8 years of experience specializing in electrical inspection and image-based yield management for LCD/OLED TFT backplanes and SMT semiconductor AOI systems. At KLA he designs signal patterns, models quantitative image data, and collaborates on algorithm development to improve defect detection and production yield. His background blends hands-on electrical circuit design, simulation-driven tuning, and field troubleshooting, enabling him to quickly narrow system issues and guide software and service teams toward practical fixes. Holding a master's in electronic and computer engineering from Korea University, he pairs academic rigor with decades of applied R&D across display and PCB inspection domains. Notably, he brings cross-disciplinary fluency—bridging analog circuitry, simulation, and image-processing analytics—to translate physical measurements into actionable detection improvements.
8 years of coding experience
3 years of employment as a software developer
석사, 전자 컴퓨터공학, 3.7, 석사, 전자 컴퓨터공학, 3.7 at 고려대학교
고려대학교 대학원