Summary
Ian Mouzon is a Data Scientist with 11 years of experience bridging academia, startups, and Big Tech, currently leading image-analysis ML pipelines at Intel for wafer defect detection. He holds a Ph.D. in Statistics and has shipped production systems across image analysis, NLP, and sensor/log analytics, turning complex, noisy data into actionable, traceable tools. Ian pairs deep Bayesian and machine learning research from Iowa State with practical feature engineering and anomaly-detection work in manufacturing and real estate AI. He has taught data mining and statistical computing, mentoring students and shaping curriculum that emphasizes model evaluation and business-ready insights. Known for leading cross-functional teams through ambiguous problems, he excels at scaling research prototypes into operational systems used across multiple process stages. Based in Portland, he blends rigorous statistical thinking with a pragmatism for production-grade ML that reduces manual inspection and improves traceability.
11 years of coding experience
3 years of employment as a software developer
Doctor of Philosophy - PhD (expected Fall 2020) Statistics, Doctor of Philosophy - PhD (expected Fall 2020) Statistics at Iowa State University
Master of Science - MS Mathematics, Master of Science - MS Mathematics at University of North Florida