Summary
Irene Battisti is a System Engineer with 9 years of experience specializing in scanning probe microscopy and condensed matter physics, currently driving AFM-based metrology development for the semiconductor industry at Nearfield Instruments. She leads probe selection and validation efforts to improve tool performance, reliability, and total cost of ownership, and has run live demos for high-end fabs as head of applications. Her background includes designing and building ultra-stiff, low-temperature STM/AFM instruments during a PhD and postdoc at Leiden University, giving her hands-on expertise in UHV, cryogenics, and low-vibration systems. She combines experimental hardware development with data analysis (Matlab/Python) and team coaching, having supervised students and engineers across projects. Notably, she bridges cutting-edge research and productization—translating delicate lab prototypes into robust tools for semiconductor manufacturing. Based in Rotterdam, she brings a rare mix of deep experimental skill and practical systems engineering to complex instrumentation challenges.
9 years of coding experience
3 years of employment as a software developer
Master’s Degree, Physics, 110/110 cum laude, Master’s Degree, Physics, 110/110 cum laude at Università degli Studi di Padova
Doctor of Philosophy - PhD, Physics, Doctor of Philosophy - PhD, Physics at Leiden University
English, Dutch, Italian, German