Summary
Jiahao Wu is a Process TD Engineer at Intel with 13 years of experience in immersion scanner lithography development and sustaining for D1C 22nm/14nm nodes, combining hands-on wafer-level problem solving with production-scale process control. He holds a PhD in Mechanical Engineering and a strong multidisciplinary background spanning mechanics, electronics, physics, chemistry and bioengineering, which he applies to yield, defect and reliability improvement. Skilled in MBPS, DOE, SPC and data-driven automation, he developed Perl/MySQL/JMP tools to close the overlay/CD feedback loop for scanner process control. His research past includes nanofluidic lab-on-chip fabrication and CNT-based MEMS, giving him uncommon depth in both semiconductor manufacturing and bio/nano device integration. Colleagues rely on him for translating complex metrology (SEM, AFM, XRD, EDX, parameter analyzers) into actionable process change and for rapidly ramping innovations into high-volume production.
13 years of coding experience
8 years of employment as a software developer
Master of Science (MS), Electrical and Electronics Engineering, Master of Science (MS), Electrical and Electronics Engineering at Shanghai Jiao Tong University
Doctor of Philosophy (PhD), Mechanical Engineering, Doctor of Philosophy (PhD), Mechanical Engineering at Louisiana State University
Transfer Student, Bioengineering, Transfer Student, Bioengineering at University of North Carolina at Chapel Hill
English, Chinese