Summary
Jinwoo Jeong is a probe process engineer with 12 years of experience applying computer science and machine learning principles to semiconductor test and yield optimization. Currently at Micron, he specializes in DRAM and HBM probe-data pipelines, developing Crunch code for cross-product analysis and driving KPI, DPAT, and repair register generation to improve wafer-level test accuracy and throughput. His background includes application engineering at Samsung focusing on NAND/SSD, PCIe and CXL performance and defect analysis, giving him a strong systems-level perspective across memory and interconnect technologies. Trained at Purdue (BS) and Georgia Tech (MS in progress), he codes in Java, C/C++, Python, assembly and even Arduino, blending low-level electrical insight with data-driven software tooling. Beyond routine analysis he frequently performs correlation studies with SimCorr and validates MES/probe datasets to ensure backend readiness, reflecting a practical focus on end-to-end manufacturability. Not obvious from titles: he moves seamlessly between writing production analysis code and hands-on probe troubleshooting, making him a rare hybrid of software engineer and process technologist.
12 years of coding experience
2 years of employment as a software developer
Master's degree, Computer Science, Master's degree, Computer Science at Georgia Institute of Technology
Bachelor of Science - BS, Computer Science, Bachelor of Science - BS, Computer Science at Purdue University