Jongmin Park is a Principal Engineer based in Seoul with nine years of focused experience in flash memory device development and a decade-long foundation in logic device metrology. He currently leads MI for 10th-generation flash products and heads metrology technology at his research lab, driving precision measurement and process control. His background spans thin-film and structural metrology techniques such as OCD and SE, and he has applied those skills across roles at Samsung Electronics and IBM on projects including VFET and Galaxy. Jongmin blends hands-on device expertise with machine learning initiatives to extract deeper signals from metrology data, improving yield and characterization. Colleagues rely on him for translating complex physical measurement challenges into practical, production-ready solutions. He combines a chemical engineering education from Sungkyunkwan University with a rare dual perspective across device physics and data-driven tooling.
Contributions:14 pushes, 1 branch in 1 year 4 months
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Jongmin Park - Principal Engineer at Samsung Electronics