Joseph Deering
Research Microscopist (Focused Ion Beam) at Canadian Centre for Electron Microscopy
Canada
Summary
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Senior🎓
Top SchoolJoseph Deering is a research microscopist and materials scientist with 10+ years of experience applying focused ion beam and multimodal imaging (SEM, TEM, X-ray CT/XRM/XRD) to solve 3D micro- and nanoscale characterization challenges across biological and engineered materials. He combines advanced specimen preparation (including cryogenic workflows and lamella liftout) with Python-driven image analysis and deep learning for segmentation, reconstruction, and quantitative interpretation of complex datasets. His work spans bones, teeth and mineralized tissues as well as semiconductors, batteries, steels, titanium alloys, thin films and additive-manufactured parts, supported by 20+ peer-reviewed papers and 40+ conference presentations. A McMaster PhD and recent McGill postdoc (NSERC-funded), he pairs rigorous academic training and awards with hands-on instrument stewardship at a national electron microscopy facility. Notably, he bridges wet-lab biological protocols and high-throughput computational imaging pipelines, making him equally fluent in sample science and data science.
10 years of coding experience
Doctor of Philosophy - PhD, Materials Engineering, Doctor of Philosophy - PhD, Materials Engineering at McMaster UniversityDiploma in Engineering, Materials Engineering, Diploma in Engineering, Materials Engineering at St. Francis Xavier UniversityBachelor’s Degree, Materials Engineering, Bachelor’s Degree, Materials Engineering at Dalhousie UniversityGithub contributions (5)
JosephAQM/JJGFinal
Nov 2015 - Dec 2015
Contributions:26 pushes, 1 branch, 1 comment in 1 month
JosephAQM/GFXA3
Dec 2015 - Dec 2015
Contributions:19 pushes, 1 branch in 9 days
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