李孟澤 is a Field Service Engineer and GaN device specialist with 10 years' experience bridging device R&D, process integration, and customer-facing test solutions. He has led GaN HEMT design and TCAD optimization, secured multiple patents in China, and managed tape-outs and yield improvements across 100V–1200V platforms. Experienced with Keysight and ipTEST instrumentation, he architects CP/KGD/FT test flows and helps customers set up labs and production testing to accelerate time-to-market. His hands-on process work includes FMEA, inline defect control, and targeted layer particle projects that measurably increased yield and reliability. Based in Taiwan with a master’s in photonics, he also codes in Go with a focus on Kubernetes, combining device-level expertise with cloud-native tooling knowledge. Notably, he moves between the bench and the field, turning complex failure analysis into practical process and test solutions for customers.
Contributions:2 PRs, 28 pushes, 19 branches in 2 years 10 months
kuberneteskubernetes-deployment
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