Masahiro Habu is an Application Manager and test systems specialist with 13 years’ experience designing and shipping semiconductor test solutions, spanning timing calibration, test program development, PCB/pin-electronics design, and mass-production yield improvement. Based in San Jose, he has progressed from DRAM calibration and system diagnosis roles to leading field applications and inventing new test techniques for memory and analog testers at Teradyne and Advantest. He combines hands‑on C/C++/Python development with practical lab engineering—building probe boards, AWG‑based sweep search methods, and factory test workflows that cut test time and improve yields. Known for translating customer requirements into deployable test systems, he also brings cross‑site factory support experience across Southeast Asia. An experienced problem solver, he holds a master’s in physical systems engineering and a QC検定2級 certification, and maintains hobbyist coding activity across C/C++/Python and other languages.
13 years of coding experience
3 years of employment as a software developer
修士(工学) 物理システム工学, 修士(工学) 物理システム工学 at Tokyo University of Agriculture and Technology
Contributions:10 PRs, 1279 pushes, 1398 branches in 4 years 2 months
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