Summary
Sangwoo Ha is an imaging and metrology specialist with eight years of experience applying physics and full-stack engineering to electron and x-ray microscopy solutions. Currently an EM Solution Manager at ZEISS Microscopy, he brings deep hands-on expertise from an 11-year tenure at Samsung Display where he built automated optical simulation and data post-processing systems to support volume manufacturing. He holds a PhD in Physics from The Australian National University and first-class honours degrees in physics and optoelectronics, combining rigorous academic training with practical industrial impact. Sangwoo blends optical simulation, failure analysis and software engineering to translate complex metrology challenges into production-ready systems, and his background suggests a rare fluency across experimental instrumentation, modeling, and code.
8 years of coding experience
12 years of employment as a software developer
Australian National University
Master of Science, Physics (First Class Honours), Master of Science, Physics (First Class Honours) at University of Auckland
English, Korean