Summary
Sonal Dey is an Applications Team Lead and former Intel staff reliability/metrology engineer with ~10 years of experience driving defect reduction and yield improvements for advanced semiconductor nodes including GAA and Intel 18A. She combines deep physics training (PhD) with hands-on metrology, failure analysis, and lifetime modeling to cut latent escapes, shorten excursion detection times, and enable high-reliability production ramps. At Intel she led cross-functional programs that delivered >60% defect reductions and a 30% drop in latent escape risk via prescreening methodologies. Her background spans supplier management, capital tool evaluation, and ML-applied scatterometry, giving her a rare blend of experimental rigor and data-driven process control. Based in Portland, she’s known for turning complex measurement challenges into cost-effective, deployable solutions that accelerate fabs to volume. An uncommonly practical scientist, she translates academic materials expertise into operational wins across multiple fabs and suppliers.
9 years of coding experience
18 years of employment as a software developer
Master of Science (MSc), Physics, Master of Science (MSc), Physics at IIT Roorkee
Bachelor of Science (B.Sc.), Physics, Bachelor of Science (B.Sc.), Physics at Gauhati University
Indian Institute of Technology Roorkee
Doctor of Philosophy (PhD), Physics, Doctor of Philosophy (PhD), Physics at Kent State University
English, Hindi, Bengali, Assamese