Steve Schneider is a research technician with 10 years of hands-on experience (and decades of institutional tenure) specializing in optical and mechanical instrumentation for contact lens metrology and advanced diagnostics. Based in Rochester, NY, he supports internal clinical studies from subject recruitment through data collection and manages SOP development, calibration, and staff training on systems such as OCT, wavefront sensors, Keyence 3D metrology, NIMO power mappers, and Clearwave aberrometers. Comfortable working with minimal supervision, he bridges engineering and clinical teams to develop measurement methods and maintain high-quality data workflows. His background in drafting and engineering technology underpins a practical, instrument-focused approach to solving measurement challenges and innovating metrology techniques.
10 years of coding experience
Engineering Technology, General, Engineering Technology, General at Rochester Institute of Technology
Associate's degree, Drafting and Design Technology, Associate's degree, Drafting and Design Technology at Alfred State College - SUNY College of Technology
Contributions:83 pushes, 2 branches in 7 years 11 months
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