Summary
Vincent De Andrade is a research scientist with nine years of experience applying physics, advanced algorithms, and software engineering to push the limits of high-resolution imaging and semiconductor metrology. He transitioned from leading a world-record 10 nm isotropic hard X-ray nano-tomography instrument at Argonne—where he combined mechatronics, 3D reconstruction and deep learning—to developing simulation, optimization, and statistical analysis tools for KLA’s next-generation metrology platforms. At KLA he helped bring cutting-edge small-angle X-ray scattering into production-ready systems for monitoring complex 3D and DRAM architectures, bridging lab-scale science and industrial deployment. He has co-authored 150+ peer-reviewed papers with over 6,000 citations, mentors students and postdocs, and uniquely pairs hands-on instrumentation design with production software development to solve practical measurement challenges.
8 years of coding experience
3 years of employment as a software developer
PhD, Earth Sciences, PhD, Earth Sciences at Université Grenoble Alpes
French, English