Summary
Yong Zhao is a Senior Microscopy Specialist with 12 years of hands-on experience operating and maintaining advanced electron and ion-beam instruments (SEM, TEM, STEM, FIB) and scanning probe microscopy, currently supporting multidisciplinary research at the Keck Center for Advanced Microscopy and Microanalysis. He combines deep technical expertise in instrumentation calibration and troubleshooting with experience coordinating user projects, training researchers, and teaching graduate labs. His background in electrospun nanofibers and nanoparticle fate from prior academic research gives him strong materials and nanoscale characterization insight that informs practical sample prep and analysis strategies. Known for clear communication and team leadership, he translates complex microscopy challenges into reproducible workflows and lab operation improvements. Based in Newark, Delaware, he pairs a PhD in Chemistry with industrial molding experience, a less-obvious blend that sharpens his problem-solving across both research and production environments.
11 years of coding experience
10 years of employment as a software developer
Doctor of Philosophy, Chemistry, Doctor of Philosophy, Chemistry at The University of Texas at El Paso
Master of Engineering - MEng, Chemical Engineering, Master of Engineering - MEng, Chemical Engineering at Hefei University of Technology
Chinese, English, Spanish