Summary
Zhoubin Cai is a Principal Test Engineer based in San Jose with over 20 years of hands-on experience in test and product engineering for memories, mixed-signal ICs, microcontrollers, analog and RF devices. He has deep expertise in semiconductor ATE platforms (Nextest Magnum/Magnum2, LTX DiamondX, ETS-88, Verigy V93000), load-board delivery, lab/prober operations, and interface-level testing (UART, SPI, I2C, JTAG, ADC/DAC). Comfortable in both silicon bring-up and production test, he pairs C/C++ programming and digital RTL/DFT know-how with strong debugging and project management skills. His recent focus on emerging NVM technologies (MRAM, ReRAM) and work across multiple startups and established fabs demonstrate an ability to shepherd novel memory products from validation to high-volume manufacturing. A persistent tinkerer and iOS/Python reader, he blends practical bench-level instincts with system-level test strategy.
9 years of coding experience
22 years of employment as a software developer
Master's degree Engineering, Master's degree Engineering at East China Institute of Technology, Nanjing, China